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9.1.3 BGA Component Reball Inspection

BGA reball inspection procedures to verify solder sphere alignment, size consistency and attachment integrity. Includes visual and measurement checks to ensure readiness for reinstallation.


REQUEST FOR QUOTE    GUIDES INDEX
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BGA Component Reball Inspection
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Crushed solder spheres. This is a reject condition.
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Excessive flux and oxidation. This is a reject condition.
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Substrate damage. This is a reject condition.
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Missing solder spheres. This is a reject condition.
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Outline

This procedure outlines the inspection method and pass/fail criteria to be used during the final inspection of BGA Component Deballing and Reballing to ensure compliance with Work Order requirements.

Minimum Skill Level - Expert

Recommended for technicians with advanced soldering and component rework skills and extensive experience in most repair/rework procedures.

Conformance Level - High

This procedure most closely duplicates the physical characteristics of the original, and most probably complies with all the functional, environmental and serviceability factors.

Tools and Materials

Procedure

Moisture Sensitive Device Control
Before processing, review the requirements for moisture sensitivity.

BGA Inspection Objective
Visual inspection confirms sphere condition, ball alignment, size, and location to ensure the reballing process complies with IPC and JEDEC specifications.

Deballing Inspection Procedure

Components shall be examined for:

  1. Pad Defects (scratches, etc.)
  2. Solder Mask Damage
  3. Residue of the previous alloy
  4. Flux Residue
  5. FOD (Foreign Objects and Debris)

Reballing Inspection Procedure

Components shall be examined for:

  1. Cracks
  2. Missing Spheres
  3. Sphere Shape
  4. Chipouts
  5. Grazed/Nicked Spheres
  6. Sphere Placement
  7. Flux
  8. Oxidation
  9. FOD (Foreign Objects and Debris)
  10. Dimensions per Mechanical Data Sheets

Disposition of Rejected Components
The Material Review Process shall address failed components due to internal or external standards.

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